Elevate your industrial inspection game with the LiSaSWIR 2048 camera from New Imaging Technologies! This SWIR line-scan array camera packs a powerful punch. With a resolution of 2048 x 1 pixel, it delivers impeccable clarity for a variety of applications. Need speed? It achieves frame rates of up to 60 kHz, ensuring you capture every critical moment. Compact and efficient, this camera is designed to integrate effortlessly into your existing systems.
Engineered for precision, the LiSaSWIR 2048 is more than just a camera—it's your partner in quality control. Its NSC1801T-SI global shutter sensor not only ensures consistent image capture but also features bad pixel replacement and embedded non-uniformity correction. This means you’ll see distinctly visible patterns with minimal noise, crucial for tasks like inspecting semiconductor, wafer, and solar cell panels, as well as food sorting and hot glass inspection.
With a structure measuring just 46 x 46 x 65.6 mm, it easily fits into tight spaces without sacrificing performance. Plus, it supports CameraLink interfaces and comes with the NITLink SDK for seamless integration into your process control systems. Transform the way you inspect and analyze with the LiSaSWIR 2048, where high performance meets user-friendly design!
Our SWIR cameras are built using proprietary manufacturing platforms, ensuring top-tier performance and precision. Developed entirely at our facility, these sensors provide unmatched imaging capabilities across a range of applications. Benefit from advanced design, quality control, and cost-effective solutions, all in one.
Our Advantages :
| Sensor | NSC1801T-SI |
| Material | InGaAs |
| Resolution | 2048x1 |
| Pixel pitch | 7.5μm |
| Spectral response | 0.9 to 1.7μm |
| Dual response | Linear (Low, Medium & High Gain) |
| Modes | ITR, ROI |
| QE | >85% |
| Output | CameraLink |
| Frame rate | 60kHz full frame |
| Exposure time | 10μs to 220ms |
| Read-out noise | 250e- (High
Gain) 450e- (Medium Gain) 4000e- (Low Gain) |
| Trigger | IN/OUT
(LVTTL-Hirose connector) IN through CC1 (CL interface) Selectable delay |
| Power Range | 12V |
| Dimension | 46x46x65.5mm |
| Mount | C-Mount native |
| Weight | < 250g |
| ADC | 14 bits |
| Operating Temp | 0°C to +65°C |
As Silicon is transparent to Short Wave Infrared wavelength (SWIR), backside wafer inspection can be done (defects detection, pattern alignment, pattern defect inspection, and edge-position bonding inspection)
Made with Visible Linescan camera (left) vs. the new LiSa SWIR (right)
Thanks to LiSa SWIR, you will be able to inspect through integrated circuit chips for quality inspection. Defects can be easily detected as cracks, voids, particles…
| Interface | GUI | SDK |
| CameraLink (Embedded) | NITLink | No |
With its unique performance and features, the LiSaSWIR 2048 is the perfect camera for industrial applications. Its 2048×1 pixels resolution with frame rate of 60kHz, Bad Pixels Replacement, and embedded Non-Uniformity Correction offer a comfortable Field of view for inspection of semiconductor/wafer/solar cell panel or food sorting, hot glass inspection.
CameraLink interface, compact size of 46* 46 * 65.6 mm, lightweight, LiSaSWIR is easy to integrate into any process control system.
LiSaSWIR 2048 - Line-scan array SWIR camera Datasheet
