hpAFM | Atomic Force Microscope
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hpAFM | Atomic Force Microscope

Are you ready to take your research to the next level? Introducing the hpAFM - a cutting-edge atomic force microscopy system designed to simplify your workflow, enhance your results, and revolutionize your understanding of materials and life sciences. Whether you work in air or liquid environments, this powerhouse of a microscope has got you covered. With its alignment-free design, closed-loop flexure scanner, decoupled z scanner, and 10 MP video microscope, you'll be amazed at the level of performance and precision you can achieve.

hpAFM | Atomic Force Microscope

Say goodbye to tedious cantilever mounting and hello to effortless alignment with hpAFM's innovative design. Simply snap on any cantilever and let the system automatically align it, eliminating the hassle of re-positioning lasers and photodiodes. And with its closed-loop flexure scanner, achieve fast, accurate positioning with minimal piezo drift - perfect for high-fidelity AFM scanning.

But that's not all. The hpAFM boasts a decoupled z scanner, eliminating the non-linearity and bowing associated with traditional tube scanners. And with its 700 nm optical resolution and 8 MP digital camera, you'll have a bird's-eye view of your sample with the ability to zoom in on specific areas with ease.

What's more, the hpAFM is designed to fit your needs, with flexible operating modes and a user-friendly interface that makes it easy to get started. Whether you're a seasoned researcher or just starting out, this microscope has everything you need to take your research to new heights. Get ready to explore the world of atomic-scale imaging with unprecedented ease and precision.


Operating Modes :
  • The microscope can be operated in the following modes:
  • Contact Mode AFM
  • Lateral Force Microscope (LFM)
  • Dynamic Mode AFM & Phase Imaging
  • Non-contact Mode AFM with digital PLL
  • Liquid AFM
  • Magnetic Force Microscope (MFM)
  • Electrostatic Force Microscope (EFM)
  • Scanning Tunnelling Microscopy (STM)
  • Piezo Response Force Microscopy (PRFM)
  • Conductive AFM (CAFM) / Scanning Spreading Resistance Microscopy (SSRM)
  • AFM Lithography (Scratching)
  • Force Modulation Mode
  • Kelvin Probe Force Microscopy (KPFM)
  • Nano Mechanical Imaging (NMI)
  • Electro Chemical AFM (EC-AFM)
  • Nanoindentation
  • Advanced PFM


Brochures & Datasheets :

   hpAFM - Atomic Force Microscope Brochure (pdf / English)


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