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Enlitech

PLIM320

PLIM320 system is the total solution for silicon photoluminescence imaging measurement system.
Features: Equipped with short-wave infrared camera SWIR InGaAs, Wavelength scanning range from 900 nm to 1700 nm, etc.

Applications: Material composition analysis, Semiconductor materials, Solar cell discrimination, LED epitaxial wafers, etc.


Details & Specifications